Fraunhofer Institute for Microstructure of Materials and Systems IMWS
Fraunhofer Institute for Microstructure of Materials and Systems IMWS

Recent research

Here we present current project examples of our work, both in our own preliminary research and in cooperation with partners and on behalf of clients.

Microstructure-based development of glasses and glass-ceramics

 

© Fraunhofer IMWS

Laser writing of microlenses for polymer-based high-performance optics

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Multidimensional gradient lenses

Plano lenses with a defined refractive index profile can be used as corrective optics for rod lenses and other plano micro-optics.

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© Fraunhofer IMWS

Innovative “LEAZit” glass-ceramic developed

The Fraunhofer IMWS has developed glass-ceramics with negative thermal expansion that can be used in high-tech products or in the mass market.  

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Microstructure diagnostics of optical materials and systems

 

© Fraunhofer IMWS / Michael Deutsch

ToF SIMS

The Fraunhofer IMWS has state-of-the-art equipment for material analysis for defect diagnostics and quality control.

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© Fraunhofer IOF

New and robust anti-reflective solutions for laser inertial fusion for the clean energy supply of the future

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© Fraunhofer IMWS

Evaluation of effect pigments and coatings

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Characterization of red phosphor for novel LEDs

The Fraunhofer IMWS supported the characterization of the synthesis of a new type of red phosphor with measurements using STEM, EDX and ToF-SIMS.

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© Fraunhofer IMWS

Identification of chemical compounds

Time-of-Flight Secondary Ion Mass Spectrometry is a method for the surface analysis of materials and enables the investigation of complex chemical compounds.

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Analysis of optical thin-film systems

 

Analysis of thin-film multilayers

Modern surface analysis methods such as ToF-SIMS are essential for making statements about the composition of multilayer stacks, for example about impurities.

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Development of preparation and diagnostic methods for microstructure diagnostics

 

© Fraunhofer IMWS

Sample preparation using focusing ion beam technology

An innovative approach for nanometer-precise high-throughput sample preparation using FIB facilitates the failure analysis of highly integrated microelectronic circuits.

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© Fraunhofer IMWS

Simplified preparation for electron microscopic examination

The “microPREP” device uses ultrashort pulse lasers to produce very thin material samples.

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