Fraunhofer Institute for Microstructure of Materials and Systems IMWSWe offer our customers a comprehensive portfolio of state-of-the-art equipment for the microstructure-based development of optical materials and technologies. We also provide the necessary human resources to make optimum use of our first-class equipment. This includes the aspiration to justify the trust of our customers with our services. With commitment, expertise and creativity, we develop tailor-made solutions for specific problems of today and, with excellent preliminary research, also for the challenges of tomorrow.
Technical Equipment
Tabbed contents
Preparation techniques
- All standard laboratory preparation techniques (wire sawing, grinding, polishing, …)
- Keramographic preparation
- Laser and ion beam-based techniques for producing cross-sections and target preparations
- Focused ion beam (FIB) processing for target preparation with nm precision
- Plasma FIB (PFIB) processing for target preparation of larger sample volumina
- Cryo-ultramicrotomy, rotational microtomy
Electron microscopy
- SEM/FIB/PFIB with EDX, WDX & EBSD
- TEM/STEM (80-300 kV), monochromated, probe and image cs corrector, large-angle EDX, SAD, BF/DF/HAADF STEM detector, low- and high-loss EELS
- STEM/TEM (80-200 kV), probe cs corrector, large-angle EDX, NBD, BF/DF STEM detector, SE detector, 4D STEM detector
- TEM/STEM (200 kV), large collecting angle EDX, SAD, BF/DF/HAADF STEM detector
Surface analysis
- Atomic force microscopy (AFM)
- Photoelectron, UV and Auger electron spectroscopy (XPS/UPS, AES)
- Time-of-flight secondary ion mass spectrometry (TOF-SIMS), also with gas cluster ion source, heating/cooling stage, sample rotation
- X-ray fluorescence spectroscopy (XRF)
Structure Determination and Spectrometry
- Differential scanning calorimetry (DSC)
- X-ray diffraction (XRD)X-ray tomography (XCT)
- UV/VIS, fluorescence and FTIR spectroscopy
- Inductively coupled plasma mass spectrometry (ICP-MS) and laser-induced breakdown spectroscopy (LIBS)