Sebastian Brand

Profiles

Team Leader Non-destructive Diagnostics, Group Diagnostics Semiconductor Technologies

Areas of research:

  • Acoustic Microscopy
  • Lock-in thermography
  • Signal analysis including AI-based methods
  • Hardware development
  • Software development
 

Academic/professional resume

 

since 2009 - present

Scientist and Research Team leader at the Fraunhofer IMWS, Halle, Germany

2007 - 2009                

Project Manager at SFK-Technologies GmbH, Germany

2006 - 2009

Research Scientist/ Post-Doc ate Martin-Luther-University of Halle-Wittenberg, Germany

2004 - 2006

Postdoctoral Fellow at Ryerson Universitiy and the Ontario Cancer Institute of the UofT, Toronto, Canada

2000 - 2003

PhD Student and scientific assistant at Institute of Biomedical Physics of the Martin-Luther University Halle-Wittenberg



Education

 

2004

PhD in Electrical Engineering from the Otto-von-Guericke-University Magdeburg, Germany

2000

Diploma in Electrical Engineering from the Technical University of Ilmenau, Germany

 

Awards

 

2018

Best interactive presentation paper award at the Electronic Components and Technology Conference 2018

 

Publications

 

2022

Defect Localization by Lock-In-Thermography

S. Brand

 

2022

Machine learning reinforced acoustic signal analysis for enhancing non-destructive defect localization and reliable identification

S Brand, M Kögel, F Altmann, C Hollerith, P Gounet

 

2022

Machine Learning Based Data and Signal Analysis Methods for Application in Failure Analysis (2022 Update)

M Kögel, S Brand, F Altmann

 

2022

Quantitative Assessment of the Porosity in Ag-sintered Joints by non-destructive acoustic Inspection supplemented with a Deep Leaning assisted Signal Analysis

S Brand, M Koegel, F Altmann, L Bach

 

2022

Vertrauenswürdigkeit sicherheitskritischer elektronischer Komponenten in einer global verflochtenen Liefer-und Wertschöpfungskette

D Koster, U Netzelmann, S Quirin, J Oswald, C Jungmann, R Rick, ...

 

2022

Analysis of Time-Resolved Thermal Responses in Lock-In Thermography by Independent Component Analysis (ICA) for a 3D Spatial Separation of Weak Thermal Sources and Defects

M Kögel, S Brand, C Große, F Altmann, KJP Jacobs, I De Wolf

 

2021

Machine Learning Based Data and Signal Analysis Methods for Application in Failure Analysis

M Kögel, S Brand, F Altmann

 

2021

Thermal source separation for 3D defect localization using independent component analysis (ICA) from time-resolved temperature response (TRTR)

M Koegel, S Brand, C Große, KJP Jacobs, I De Wolf, F Altmann

 

2021

Deep Learning assisted quantitative Assessment of the Porosity in Ag-Sinter joints based on non-destructive acoustic inspection

S Brand, M Koegel, F Altmann, L Bach

 

2021

Thermal source separation for 3D localization using independent component analysis (ICA) from time-resolved temperature response (TRTR)

M Kogel, S Brand, KJP Jacobs, I De Wolf, F Altmann

 

2021

Enhanced non-contact ultrasonic testing using an air-coupled optical microphone

G Kaniak, W Rohringer, M Brauns, N Panzer, F Lücking, B Fischer, ...

 

2020

Advanced 3D localization in Lock-In Thermography based on the analysis of the TRTR (Time-Resolved Thermal Response) received upon arbitrary waveform stimulation

S Brand, M Kögel, C Grosse, F Altmann, B Lai, Q Wang, J Vickers, D Tien, ...

 

2019

Machine learning assisted signal analysis in Acoustic Microscopy for non-destructive defect identification

M Kögel, S Brand, F Altmann

 

2019

GHz-Scanning Acoustic Microscopy Combined with ToF-SIMS/AFM for Wafer-Level Failure Analysis of Bonding Interfaces

I De Wolf, A Khaled, A Franquet, V Spampinato, T Conard, S Brand, ...

 

2019

Acoustic Microscopy of Semiconductor Packages

CD Hartfield, TM Moore, S Brand

 

2019

3D Hot-Spot Localization by Lock-in Thermography

S Brand, F Altmann

 

2019

Utilization of scanning acoustic microscopy (SAM) in quantifying the biomechanical variations in tissues with Fuchs endothelial dystrophy (FECD)

JM Perone, ETA Mohamed, M Koegel, NF Declercq

 

2019

An alternative application of ToF-SIMS/in-situ AFM: controlled sample preparation for IC failure analysis

A Franquet, V Spampinato, A Khaled, T Conard, S Brand, M Kogel, ...

 

2019

Non-destructive visualization of bond pad defects using acoustic microscopy in the GHz-band

S Brand, M Kögel, F Altmann, S Oberhoff, M Wiedenmann, J Krinke, ...

 

2018

High Resolution Acoustic GHz Microscopy

S Brand, M Kögel, F Altmann